J. R. Williams, I. Píš, M. Kobata, et al., “Observation and simulation of hard x ray photoelectron diffraction to determine polarity of polycrystalline zinc oxide films with rotation domains,” in J. Appl. Phys., Vol. 111, No. 3, pp. 033 525, 2012.

J. R. Williams, I. Píš, M. Kobata, et al., “Observation and simulation of hard x ray photoelectron diffraction to determine polarity of polycrystalline zinc oxide films with rotation domains,” in J. Appl. Phys., Vol. 111, No. 3, pp. 033 525, 2012.

J. R. Williams, I. Píš, M. Kobata, et al., “Observation and simulation of hard x ray photoelectron diffraction to determine polarity of polycrystalline zinc oxide films with rotation domains,” in J. Appl. Phys., Vol. 111, No. 3, pp. 033 525, 2012.

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