I. Afanasyev-Charkin, D. Cooke, M. Ishimaru, B.L. Bennet, V.T.Gritsyna, J.R. Williams, K.E. Sickafus, “Refractive indices of metastable and amorphousphases in Ne+-ion irradiated magnesium–aluminate spinel,” in Optical Materials, Vol. 16, No. 3, pp. 397–402, 2001, ISSN: 0925-3467.
I. Afanasyev-Charkin, D. Cooke, M. Ishimaru, B.L. Bennet, V.T.Gritsyna, J.R. Williams, K.E. Sickafus, “Refractive indices of metastable and amorphousphases in Ne+-ion irradiated magnesium–aluminate spinel,” in Optical Materials, Vol. 16, No. 3, pp. 397–402, 2001, ISSN: 0925-3467.
L.K. Shrestha, J.-S. Wi, J. Williams, M. Akada, and K. Ariga, “Facile fabrication of silver nanoclusters as promising surface-enhanced raman scattering substrates,”in J. Nanosci. Nanotechnol., Vol. 14, No. 3, 2245—2251, 2014, ISSN: 1533-4880.
L.K. Shrestha, J.-S. Wi, J. Williams, M. Akada, and K. Ariga, “Facile fabrication of silver nanoclusters as promising surface-enhanced raman scattering substrates,”in J. Nanosci. Nanotechnol., Vol. 14, No. 3, 2245—2251, 2014, ISSN: 1533-4880.
J. R. Williams, I. Píš, M. Kobata, et al., “Observation and simulation of hard x ray photoelectron diffraction to determine polarity of polycrystalline zinc oxide films with rotation domains,” in J. Appl. Phys., Vol. 111, No. 3, pp. 033 525, 2012.
J. R. Williams, I. Píš, M. Kobata, et al., “Observation and simulation of hard x ray photoelectron diffraction to determine polarity of polycrystalline zinc oxide films with rotation domains,” in J. Appl. Phys., Vol. 111, No. 3, pp. 033 525, 2012.
T. Ogino, J.R. Williams, K. Watanabe, et al., “Effect of crystalline polarity on microstructure and optoelectronic properties of gallium-doped zinc oxide films deposited onto glass substrates,” in Thin Solid Films, Vol. 552, pp. 56–61, 2014, ISSN: 0040-6090.
T. Ogino, J.R. Williams, K. Watanabe, et al., “Effect of crystalline polarity on microstructure and optoelectronic properties of gallium-doped zinc oxide films deposited onto glass substrates,” in Thin Solid Films, Vol. 552, pp. 56–61, 2014, ISSN: 0040-6090.
J.R. Williams and D.R. Clarke, “Strengthening gold thin films with zirconia nanoparticles for MEMS electrical contacts,” in Acta Materialia, Vol. 56, No. 8, pp. 1813–1819, 2008, ISSN: 1359-6454.
J.R. Williams and D.R. Clarke, “Strengthening gold thin films with zirconia nanoparticles for MEMS electrical contacts,” in Acta Materialia, Vol. 56, No. 8, pp. 1813–1819, 2008, ISSN: 1359-6454.
J.R. Williams, H. Furukawa, Y. Adachi, S. Grachev, E. Søndergård, and N. Ohashi, “Polarity control of intrinsic ZnO films using substrate bias,” in Appl. Phys. Lett., Vol. 103, No. 4, pp. 042107-1–042107-4, 2013.
J.R. Williams, H. Furukawa, Y. Adachi, S. Grachev, E. Søndergård, and N. Ohashi, “Polarity control of intrinsic ZnO films using substrate bias,” in Appl. Phys. Lett., Vol. 103, No. 4, pp. 042107-1–042107-4, 2013.
T. Ohsawa, S. Ueda, M. Suzuki, Y. Tateyama, J.R. Williams, and N. Ohashi, “Investigating crystalline-polarity-dependent electronic structures of GaN by hard x-ray photoemission and ab-initio calculations,” in Appl. Phys. Lett., Vol. 107, No. 17, pp. 171604-1–171604-5, 2015.
T. Ohsawa, S. Ueda, M. Suzuki, Y. Tateyama, J.R. Williams, and N. Ohashi, “Investigating crystalline-polarity-dependent electronic structures of GaN by hard x-ray photoemission and ab-initio calculations,” in Appl. Phys. Lett., Vol. 107, No. 17, pp. 171604-1–171604-5, 2015.
J.R. Williams, M. Kobata, I. Pis, et al., “Polarity determination of wurtzite-type crystals using hard x-ray photoelectron diffraction,”in Surf. Sci., Vol. 605, No. 13, pp. 1336–1340, 2011, ISSN: 0039-6028.
J.R. Williams, M. Kobata, I. Pis, et al., “Polarity determination of wurtzite-type crystals using hard x-ray photoelectron diffraction,”in Surf. Sci., Vol. 605, No. 13, pp. 1336–1340, 2011, ISSN: 0039-6028.
T. Kolodiazhnyi, M. Valant, J.R. Williams, et al., “Evidence of Eu2+ 4f electrons in the valence band spectra of EuTiO3 and EuZrO3,” in J. Appl. Phys., Vol. 112, No. 8, pp. 083719-1–083719-5, 2012.
T. Kolodiazhnyi, M. Valant, J.R. Williams, et al., “Evidence of Eu2+ 4f electrons in the valence band spectra of EuTiO3 and EuZrO3,” in J. Appl. Phys., Vol. 112, No. 8, pp. 083719-1–083719-5, 2012.
J. Williams, H. Yoshikawa, S. Ueda, et al., “Polarity-dependent photoemission spectra of wurtzite-typezinc oxide,”in Appl. Phys. Lett., Vol. 100, No. 5, pp. 051902-1–051902–3, 2012, ISSN: 0003-6951.
J. Williams, H. Yoshikawa, S. Ueda, et al., “Polarity-dependent photoemission spectra of wurtzite-typezinc oxide,”in Appl. Phys. Lett., Vol. 100, No. 5, pp. 051902-1–051902–3, 2012, ISSN: 0003-6951.
